Preferred Label : Scanning Electron Microscope;
NCIt synonyms : SEM;
NCIt definition : An electron microscope that scans the surface of a sample with a beam of electrons
and detects the interaction of the electrons with the atoms on the surface to produce
a topographical image of the sample.;
Origin ID : C78814;
UMLS CUI : C0262878;
Automatic exact mappings (from CISMeF team)
Semantic type(s)
UMLS correspondences (same concept)