Preferred Label : scanning electron microscopy;
Detailed label : scanning electron microscopy (SEM);
IUPAC acronym : SEM;
IUPAC definition : Any analytical technique which involves the generation and evaluation of secondary
electrons (and to a lesser extent back scattered electrons) by a finely focused electron
beam (typically 10 nm or less) for high resolution and high depth of field imaging.;
Origin ID : S05484;
Automatic exact mappings (from CISMeF team)
- False automatic mappings
- See also
Any analytical technique which involves the generation and evaluation of secondary
electrons (and to a lesser extent back scattered electrons) by a finely focused electron
beam (typically 10 nm or less) for high resolution and high depth of field imaging.
