Atomic Force Microscopy

Preferred Label : Atomic Force Microscopy;

NCIt synonyms : Scanning Force Microscopy;

NCIt definition : A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution.;

Details

Origin ID

C17754;

UMLS CUI

C0242849;

Automatic exact mappings (from CISMeF team)
- Atomic force microscopes [PASCAL theme]
- Scanning force microscopy [OMIConto structure]
Currated CISMeF NLP mapping
- microscopy, atomic force [MeSH Descriptor]
- microscopy, atomic force [MeSH concept]
Semantic type(s)
- Laboratory Procedure [UMLS semantic type]
UMLS correspondences (same concept)
- microscopy, atomic force [MeSH concept]
- microscopy, atomic force [MeSH Descriptor]

Keyword's position in hierarchy(ies) :

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