" /> microscopy, atomic force - CISMeF





Preferred Label : microscopy, atomic force;

MeSH definition : A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.;

MeSH synonym : atomic force microscopies; force microscopies; force microscopies, scanning; force microscopy; microscopies, force; microscopy, force; microscopy, scanning force; scanning force microscopies; scanning force microscopy; force microscopy, scanning; microscopies, scanning force; atomic force microscopy; microscopies, atomic force;

Wikipedia link : https://en.wikipedia.org/wiki/Atomic force microscopy;

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Keyword's position in hierarchy(ies) : arborescence

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A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

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01/05/2025


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