Secondary Ion Mass Spectrometry

Preferred Label : Secondary Ion Mass Spectrometry;

NCIt definition : An analytical technique in which a mass spectrometer is used to detect sputtered ionized atoms (secondary ions) that are ejected from a solid surface after application of a beam of high energy primary ions.;

Alternative definition : CDISC: An analytical technique in which a mass spectrometer is used to measure the atomic weight of sputtered ionized atoms (secondary ions) that are ejected from a solid surface after application of a beam of high energy primary ions.;

Details

Origin ID

C154790;

UMLS CUI

C0242851;

Automatic exact mappings (from CISMeF team)
- spectrometry, mass, secondary ion [MeSH Descriptor]
- spectrometry, mass, secondary ion [MeSH concept]
Semantic type(s)
- Laboratory Procedure [UMLS semantic type]
UMLS correspondences (same concept)
- spectrometry, mass, secondary ion [MeSH Descriptor]
- spectrometry, mass, secondary ion [MeSH concept]
concept_is_in_subset
- CDISC SDTM Method Terminology [NCIt concept]
- CDISC SDTM Terminology [NCIt concept]
- Clinical Data Interchange Standards Consortium Terminology [NCIt concept]

Keyword's position in hierarchy(ies) :

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