Focused Ion Beam-Scanning Electron Microscope

Preferred Label : Focused Ion Beam-Scanning Electron Microscope;

NCIt synonyms : FIB-SEM; FIB/SEM; Focused Ion Beam Scanning Electron Microscope;

NCIt definition : An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the sample.;

Details

Origin ID

C78815;

UMLS CUI

C2700202;

Automatic exact mappings (from CISMeF team)
- Volume Electron Microscopy [MeSH Descriptor]
Currated CISMeF NLP mapping
- Focused Ion Beam Scanning Electron Microscopy [MeSH concept]
Semantic type(s)
- Medical Device [UMLS semantic type]
Validated automatic mappings to NTBT
- Volume Electron Microscopy [MeSH Descriptor]

Keyword's position in hierarchy(ies) :

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