Atomic Resolution Microscopy

Preferred Label : Atomic Resolution Microscopy;

NCIt synonyms : Scanning Probe Microscopy; Atomic Scale Microscopy; SPM;

NCIt definition : Several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms. These technologies share the concept of scanning an extremely sharp tip (3-50 nm radius of curvature) across the object surface. The tip is mounted on a flexible cantilever, allowing the tip to follow the surface profile. When the tip moves in proximity to the investigated object, forces of interaction between the tip and the surface influence the movement of the cantilever. Various interactions can be studied depending on the specific mechanics of the probe. Specialized sensors detect and record the movements of the cantilever, providing an image with resolution at the atomic level.;

NCIt note : Scanning probe microscopy types include atomic force microscopy, magnetic force microscopy, scanning tunneling microscopy and force modulation microscopy.;

Details

Origin ID

C20346;

UMLS CUI

C0677615;

Automatic exact mappings (from CISMeF team)
- Scapuloperoneal myopathy, X-linked dominant [OMIM Phenotype]
- myocardial perfusion imaging [MeSH Descriptor]
- premenstrual syndrome [MeSH Descriptor]
Currated CISMeF NLP mapping
- microscopy, scanning probe [MeSH Descriptor]
- microscopy, scanning probe [MeSH concept]
Semantic type(s)
- Research Activity [UMLS semantic type]
UMLS correspondences (same concept)
- microscopy, scanning probe [MeSH Descriptor]
- microscopy, scanning probe [MeSH concept]

Keyword's position in hierarchy(ies) :

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