Preferred Label : transmission electron microscopy;
Detailed label : transmission electron microscopy (TEM);
IUPAC acronym : TEM;
IUPAC definition : Any technique in which an electron transparent sample is bombarded with an electron
beam and the intensity of the transmitted electrons which is determined by scattering
phenomena (electron absorption phenomena) in the interior of the sample is recorded.
TEM essentially provides a high resolution image of the microstructure of a thin sample.
This technique is often just called electron microscopy. The term transmission electron
microscopy is however recommended for the sake of a clear distinction from other electron
microscopic techniques.;
Origin ID : T06481;
Automatic exact mappings (from CISMeF team)
- False automatic mappings
- See also
Any technique in which an electron transparent sample is bombarded with an electron
beam and the intensity of the transmitted electrons which is determined by scattering
phenomena (electron absorption phenomena) in the interior of the sample is recorded.
TEM essentially provides a high resolution image of the microstructure of a thin sample.
This technique is often just called electron microscopy. The term transmission electron
microscopy is however recommended for the sake of a clear distinction from other electron
microscopic techniques.
