Preferred Label : secondary electron yield;
Detailed label : secondary electron yield in in situ microanalysis;
IUPAC definition : The number of secondary electrons generated per primary electron for a given specimen
and experimental conditions. It depends on the (mean) atomic number of the excited
area of the sample, the angle between electron beam and sample surface, the primary
electron energy, thickness of the sample and sample potentials.;
Origin ID : S05519;
See also
The number of secondary electrons generated per primary electron for a given specimen
and experimental conditions. It depends on the (mean) atomic number of the excited
area of the sample, the angle between electron beam and sample surface, the primary
electron energy, thickness of the sample and sample potentials.
