Preferred Label : scanning transmission electron microscopy;
Detailed label : scanning transmission electron microscopy (STEM);
IUPAC acronym : STEM; TEM;
IUPAC definition : A special TEM-technique in which an electron transparent sample is bombarded with
a finely focused electron beam (typically of a diameter of less than 10 nm) which
can be scanned across the specimen or rocked across the optical axis and transmitted,
secondary, back scattered and diffracted electrons as well as the characteristic X-ray
spectrum can be observed. STEM essentially provides high resolution imaging of the
inner microstructure and the surface of a thin sample (or small particles), as well
as the possibility of chemical and structural characterization of micrometer and sub-micrometer
domains through evaluation of the X-ray spectra and the electron diffraction pattern.;
Origin ID : S05486;
Automatic exact mappings (from CISMeF team)
- TEM [ICHI extension code]
- False automatic mappings
- See also
A special TEM-technique in which an electron transparent sample is bombarded with
a finely focused electron beam (typically of a diameter of less than 10 nm) which
can be scanned across the specimen or rocked across the optical axis and transmitted,
secondary, back scattered and diffracted electrons as well as the characteristic X-ray
spectrum can be observed. STEM essentially provides high resolution imaging of the
inner microstructure and the surface of a thin sample (or small particles), as well
as the possibility of chemical and structural characterization of micrometer and sub-micrometer
domains through evaluation of the X-ray spectra and the electron diffraction pattern.
