Preferred Label : in situ micro-X-ray diffraction;
Detailed label : in situ micro-X-ray diffraction (Kossel-technique);
IUPAC definition : Any technique which utilizes the diffraction of X-rays generated in a microstructural
domain of a solid under bombardment with a finely focused electron beam, thus providing
an X-ray diffraction pattern of this microstructural domain. The pattern can be recorded
with a film either on the reflection or transmission side of the specimen (in the
latter case the crystalline sample has to be a thin film or a small particle).;
Origin ID : I03060;
See also
Any technique which utilizes the diffraction of X-rays generated in a microstructural
domain of a solid under bombardment with a finely focused electron beam, thus providing
an X-ray diffraction pattern of this microstructural domain. The pattern can be recorded
with a film either on the reflection or transmission side of the specimen (in the
latter case the crystalline sample has to be a thin film or a small particle).
